Skill Level 1

Contents - SS033400003

Introduction - SS033400005

Telephone Circuit Conditioning
Page Navigation
4

MOS 32D

Skill Level 1

Task No.

Task Statement

113-616-3016

Test Circuit for Maximum Allowable Channel

Noise

113-616-3018

Test Circuit for Impulse Noise

MOS 32D

Skill Level 2

Task No.

Task Statement

113-616-3021

Test Circuit

for

Harmonic Distortion

113-616-3023

Test Circuit

for

Intermodulation Distortion

113-616-3017

Test Circuit

for

Single Tone Interference

113-616-3019

Test Circuit

for

Terminal Impedance

113-616-3015

Test Circuit

for

Minimum Longitudinal

Balance

113-616-3022

Test Circuit

for Phase Jitter

113-616-3011

Test Circuit

for Frequency Response

113-616-3012

Test Circuit

for Envelope Delay

MOS 31N

Skill Level 1

Task No.

Task Statement

113-616-3002

Test Local Manual Telephone Switchboard

Circuits

113-616-3003

Test Local Automatic Switchboard Circuits

113-616-3004

Test 4-Wire TA-341/TT or TA-838 Telephone

Sets and Circuits

113-616-3005

Test 4-Wire Circuits to CV-1919 or CV-1918

Telephone

Converter

iii

Western Governors University

Privacy Statement
Press Release
Contact

Integrated Publishing, Inc. - A (SDVOSB) Service Disabled Veteran Owned Small Business