Description of the Improvements Made in Communication Circuits Over the Last DecadeLesson 1. Communication Circuit Quality - SS033250008Learning Event 2: Effect of NoiseLearning Event 3: Suppression of Manmade NoiseLearning Event 4: Improving the Signal-to-Noise RatioTechniques. - SS033250012Radio receiver. - SS033250013Peak limiters.Learning Event 5: InterferenceLearning Event 6: DistortionLearning Event 7: Long-distance communications networksEqualization.Learning Event 9: Telegraph Signal QualitySources of telegraph distortion.Data-transmission.Serial-Parallel transmission.Figure 1. Serial-parallel conversion, block diagram.Learning Event 10: Communications controlLearning Event 12: Standards for Noise MeasurementUnits of noise measurement.Calculations.Practice Exercise - SS033250028Practice Exercise (cont) - SS033250029Practice Exercise (cont) - SS033250030Practice Exercise (cont) - SS033250031Practice Exercise (cont) - SS033250032Practice Exercise (cont) - SS033250033Lesson 1. Communication Circuit Quality - SS033250034Lesson 2. Concepts of Circuit Conditioning - SS033250035Figure 2. Basic conditions for circuit conditioning, block diagram.DCA circuit specifications.Read and study.Impedance matching.Learning Event 4: Precautions in Tesing DC CircuitsCircuit categories.Enclosure 124 tests listed in DCAC 300-175-9 ExtractFrequency response (insertion loss).Frequency response (insertion loss). (Cont)Listing of characteristics.Learning Event 6: Expanded Circuit ParametersPractice Exercise - SS033250048Practice Exercise (Cont) - SS033250049Practice Exercise (Cont) - SS033250050Practice Exercise (Cont) - SS033250051Practice Exercise (Cont) - SS033250052Practice Exercise (Cont) - SS033250053Lesson 2. Concepts of Circuit Conditioning - SS033250054Lesson 3. Circuit Conditioning Test SetsLearning Event 2: Corrective DevicesFigure 3. Transmission Impairment Measuring Set (TIMS) HP Model 4940AOperational controls.Digital display.Measurement switch.Transmitter controls.15 push button switchesNoise filter.Display key.Nonlinear distortion.Learning Event 4: TIMS ReplacementFigure 4. Telephone Test Set AN/USM-181.Learning Event 6: Noise-Level-VU Measuring Set, Model TTS-37B.Sensitivity.Figure 5. Measuring set noise-level-VU, Model TTS-37B and TTS-37BRLearning Event 7: Tektronix Oscilloscope AN/USM-281C.Figure 6. Oscilloscope, AN/USM-281C.Learning Event 8: Delay Equalizer Group, OA-880/FTC (UE-5).Figure 7. Delay equalizer group, OA-880/FTC (UE-5)Practice Exercise - SS033250075Practice Exercise (Cont) - SS033250076Practice Exercise (Cont) - SS033250077Practice Exercise (Cont) - SS033250078Lesson 3. Conditioning test SetTM Extract Lesson 2Table 1. DCS Technical Schedules for Government-Owned CircuitsTable 1. DCS Technical Schedules for Government-Owned Circuits (Cont) - SS033250082Table 1. DCS Technical Schedules for Government-Owned Circuits (Cont) - SS033250083Table 1. DCS Technical Schedules for Government-Owned Circuits (Cont) - SS033250084Table 1. DCS Technical Schedules for Government-Owned Circuits (Cont) - SS033250085Table 1. DCS Technical Schedules for Government-Owned Circuits (Cont) - SS033250086Table 2. DCS Technical Schedules for Government-Owned Circuits (Circuit Parameters)Table 2. DCS Technical Schedules for Government-Owned Circuits (Circuit Parameters) (Cont) - SS033250088Table 2. DCS Technical Schedules for Government-Owned Circuits (Circuit Parameters) (Cont) - SS033250089Table 2. DCS Technical Schedules for Government-Owned Circuits (Circuit Parameters) (Cont) - SS033250090Table 2. DCS Technical Schedules for Government-Owned Circuits (Circuit Parameters) (Cont) - SS033250091Table 3. DCS Technical Schedules for Government-Owned Circuits Group Bandwidth Circuits - FDM or Data DerivedTable 3. DCS Technical Schedules for Government-Owned Circuits Group Bandwidth Circuits - FDM or Data Derived (cont) - SS033250093Table 3. DCS Technical Schedules for Government-Owned Circuits Group Bandwidth Circuits - FDM or Data Derived (cont) - SS033250094Table 4. DCS Technical Schedules for Government-Owned Circuits Z1, Z2, Z3 Technical SchedulesTable 4. DCS Technical Schedules for Government-Owned Circuits Z1, Z2, Z3 Technical Schedules (Cont)Footnotes to Table 4Table 5. Cross-Reference Between Description of DCS Service Item Number and Applicable Circuit Parameter CodeTM Extracts Lesson 3 - SS033250099Table 8-1. Controls, Jacks and SwitchesTable 8-1. Controls, Jacks and Switches (Cont)TM Extracts Lesson 3 - SS033250102Figure - SS033250103Figure 3-1. Oscilloscope controls, indicators, devices and connectorsTable 3-1. Controls, indicators, devices and connectorsTable 3-1. Controls, indicators, devices and connectors (Cont) - SS033250106Table 3-1. Controls, indicators, devices and connectors (Cont) - SS033250107Table 3-1. Controls, indicators, devices and connectors (Cont) - SS033250108Practice Exercise/Solution SheetPractice Exercise/Solution Sheet (Cont) - SS033250111Practice Exercise/Solution Sheet (Cont) - SS033250112Practice Exercise/Solution Sheet (Cont) - SS033250113Introduction to Circuit Conditioning